New XPS/AES at the School of Engineering : information meeting
Event details
| Date | 03.02.2015 |
| Hour | 12:15 › 13:00 |
| Speaker | Prof. H.-A. Klok (head of MHMC), Dr S. Mischler |
| Location | |
| Category | Conferences - Seminars |
Since 1974 researchers from IMX and EPFL have access to surface analytical techniques by XPS, AES and SIMS managed till 2006 by the Laboratory of Metallurgical Chemistry and afterwards by the CIME. Since 2014 this task was taken over by the MHMC (Molecular and Hybrid Materials Characterization center , http://mhmc.epfl.ch/). This coincided with a revamp of the available equipment through the purchase of two advanced XPS and AES instruments that are now operational:
- A PHI VersaProbeII XPS system featuring a small spot X-Ray beam, automated charge compensation, monoatomic and cluster ion guns (Ar+, C60, Ar cluster), heating/cooling stage, angle resolves XPS.
- A PHI 680 Scanning Auger Microscope with typical beam size in analytical mode of 10 nm combined with Ar+ ion depth sputter profiling.
To celebrate the new equipment, the MHMC invites you (and any other interested person) to an information meeting on February 3, 2015 12:15-13:00, room MXG110. Refreshments will be available.
The program includes a welcome by Prof. H.-A. Klok (head of MHMC), the presentation by Dr S. Mischler (responsible for the surface analysis platform of MHMC) of the new instruments and of the services offered to EPFL users . At the end, participants will have the opportunity to visit the surface analysis facilities.
Please, in order to facilitate organization, fill the following Doodle if you intend to participate: http://doodle.com/xwdkqfngbq9z93ng
- A PHI VersaProbeII XPS system featuring a small spot X-Ray beam, automated charge compensation, monoatomic and cluster ion guns (Ar+, C60, Ar cluster), heating/cooling stage, angle resolves XPS.
- A PHI 680 Scanning Auger Microscope with typical beam size in analytical mode of 10 nm combined with Ar+ ion depth sputter profiling.
To celebrate the new equipment, the MHMC invites you (and any other interested person) to an information meeting on February 3, 2015 12:15-13:00, room MXG110. Refreshments will be available.
The program includes a welcome by Prof. H.-A. Klok (head of MHMC), the presentation by Dr S. Mischler (responsible for the surface analysis platform of MHMC) of the new instruments and of the services offered to EPFL users . At the end, participants will have the opportunity to visit the surface analysis facilities.
Please, in order to facilitate organization, fill the following Doodle if you intend to participate: http://doodle.com/xwdkqfngbq9z93ng
Links
Practical information
- Informed public
- Registration required
- This event is internal
Organizer
- H.-A. Klok, S. Mischler
Contact
- S. Mischler